Cover image for Nanometrology using the transmission electron microscope
Başlık:
Nanometrology using the transmission electron microscope
Yazar:
Stolojan, Vlad, author.
ISBN:
9781681741208

9781681742489
Fiziksel Tanım:
1 online resource (various pagings) : illustrations (some color).
Series:
IOP concise physics,

IOP concise physics.
General Note:
"Version: 20140901"--Title page verso.

"A Morgan & Claypool publication as part of IOP Concise Physics"--Title page verso.
Contents:
Preface -- Acknowledgements -- Author biography -- 1. Introduction -- 1.1. The TEM

2. Imaging -- 2.1. Resolution -- 2.2. Image calibration -- 2.3. Sample orientation -- 2.4. Modes of imaging and diffraction

3. Spectroscopy -- 3.1. EDX -- 3.2. EELS.
Abstract:
The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. Recent technological breakthroughs have revolutionized our understanding of materials via use of the TEM, and it promises to become a significant tool in understanding biological and bio-molecular systems such as viruses and DNA molecules. This book is a practical guide for scientists who need to use the TEM as a tool to answer questions about physical and chemical phenomena on the nanoscale.
Reading Level:
Scientists using Transmission Electron Microscopes in materials science, biology, life science, chemistry.